Research ArticleMICROSCOPY

Nanoscale chemical imaging by photoinduced force microscopy

Science Advances  25 Mar 2016:
Vol. 2, no. 3, e1501571
DOI: 10.1126/sciadv.1501571

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Abstract

Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.

Keywords
  • Microscopy
  • chemical imaging
  • block copolymers
  • midInfared spectroscopy
  • force microscopy
  • atomic force microscopy
  • directed self-assembly
  • near-field imaging
  • polarizability
  • image dipole

This is an open-access article distributed under the terms of the Creative Commons Attribution-NonCommercial license, which permits use, distribution, and reproduction in any medium, so long as the resultant use is not for commercial advantage and provided the original work is properly cited.

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