Research ArticleNANOELECTRONICS

Ultraflexible nanoelectronic probes form reliable, glial scar–free neural integration

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Science Advances  15 Feb 2017:
Vol. 3, no. 2, e1601966
DOI: 10.1126/sciadv.1601966

Article Information

vol. 3 no. 2

Online ISSN: 
History: 
  • Received for publication August 19, 2016
  • Accepted for publication January 10, 2017

Author Information

  1. Lan Luan1,*,
  2. Xiaoling Wei2,*,
  3. Zhengtuo Zhao2,*,
  4. Jennifer J. Siegel3,
  5. Ojas Potnis2,
  6. Catherine A Tuppen2,
  7. Shengqing Lin2,
  8. Shams Kazmi2,
  9. Robert A. Fowler2,
  10. Stewart Holloway2,
  11. Andrew K. Dunn2,
  12. Raymond A. Chitwood3 and
  13. Chong Xie2,
  1. 1Department of Physics, the University of Texas at Austin, Austin, TX 78712–1192, USA.
  2. 2Department of Biomedical Engineering, the University of Texas at Austin, Austin, TX 78712–1192, USA.
  3. 3Center for Learning and Memory, Institute for Neuroscience, the University of Texas at Austin, Austin, TX 78712–1192, USA.
  1. Corresponding author. Email: chongxie{at}utexas.edu
    • * These authors contributed equally to this work.

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