Research ArticleChemistry

Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy

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Science Advances  23 Jun 2017:
Vol. 3, no. 6, e1700255
DOI: 10.1126/sciadv.1700255

Article Information

vol. 3 no. 6

Online ISSN: 
History: 
  • Received for publication January 24, 2017
  • Accepted for publication May 16, 2017

Author Information

  1. Le Wang1,
  2. Haomin Wang1,
  3. Martin Wagner2,
  4. Yong Yan3,
  5. Devon S. Jakob1 and
  6. Xiaoji G. Xu1,*
  1. 1Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.
  2. 2Bruker Nano, 112 Robin Hill Road, Santa Barbara, CA 93117, USA.
  3. 3Department of Chemistry and Environmental Science, New Jersey Institute of Technology, Newark, NJ 07102, USA.
  1. *Corresponding author. Email: xgx214{at}lehigh.edu

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