Science Advances

Supplementary Materials

This PDF file includes:

  • fig. S1. XRD patterns of the SCWO films with different thicknesses.
  • fig. S2. Field cooling (200 Oe) temperature-dependent magnetization of the S-1, S-2, and S-3 films.
  • fig. S3. The methods for transport property measurement and the transport properties of the heated bare STO substrate and S-2 films with and without a magnetic field.
  • fig. S4. XRD patterns of the SCWO films fabricated with oxygen pressures of 0.5 and 1.5 Pa.
  • fig. S5. AFM and cross-sectional TEM images of the SCWO films fabricated with an oxygen pressure of 0.5 Pa.
  • fig. S6. The temperature-dependent resistance of the films deposited under an oxygen pressure of 0.5 Pa.
  • fig. S7. The temperature-dependent resistivity of the S-2 films with the external magnetic field parallel to the thin film but still perpendicular to the current.
  • fig. S8. Field-dependent MR of the S-2 films up to 14 T.
  • fig. S9. Evolution of magnetic structure and magnetic domain of the SCWO without and with a magnetic field.
  • fig. S10. The valence states of Cr and W cations.

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