Science Advances

Supplementary Materials

This PDF file includes:

  • Supplementary Discussion 1. List of samples and their nomenclature.
  • Supplementary Discussion 2. Sample preparation and characterization.
  • Supplementary Discussion 3. HRTEM results and analysis.
  • Supplementary Discussion 4. TRIM calculations results and analysis.
  • Supplementary Discussion 5. XPS spectra at various depths and consideration of various effects during analysis.
  • Supplementary Discussion 6. XPS results and analysis for chemical and interfacial bonding.
  • Supplementary Discussion 7. Structural properties by XPS and Raman spectroscopy.
  • Supplementary Discussion 8. Surface roughness of the auxiliary samples.
  • Supplementary Discussion 9. Nanomechanical and nanotribological properties results and analysis.
  • Supplementary Discussion 10. Ball-on-disk microscale tribological results and analysis.
  • Supplementary Discussion 11. Wear track analysis by Raman spectroscopy.
  • Supplementary Discussion 12. Fundamentals of TD technology and tape heads and evaluation of THW by optical microscopy, AES imaging, and AES depth profiles.
  • Table S1. Description and nomenclature of all samples.
  • Fig. S1. HRTEM imaging.
  • Fig. S2A. TRIM calculations.
  • Fig. S2B. TRIM calculations.
  • Fig. S2C. TRIM calculations.
  • Fig. S2D. TRIM calculations.
  • Fig. S2E. TRIM calculations.
  • Fig. S2F. TRIM calculations.
  • Fig. S2G. TRIM calculations.
  • Fig. S2H. TRIM calculations.
  • Fig. S3. XPS analysis.
  • Fig. S4. Interface analysis by XPS.
  • Fig. S5. Structural properties.
  • Fig. S6. Surface roughness measurements of the auxiliary samples.
  • Fig. S7. AFM imaging before and after nanoindentation and nanoscratch tests.
  • Fig. S8. Comprehensive friction and wear results for all samples.
  • Fig. S9. Raman spectroscopy for wear analysis of various samples.
  • Fig. S10. Fundamentals of magnetic tape heads and analyses of THW by optical microscopy, AES imaging, and AES depth profiles.
  • References (4152)

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