Research ArticleMATERIALS SCIENCE

In operando x-ray imaging of nanoscale devices: Composition, valence, and internal electrical fields

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Science Advances  08 Dec 2017:
Vol. 3, no. 12, eaao4044
DOI: 10.1126/sciadv.aao4044

Article Information

vol. 3 no. 12

Online ISSN: 
History: 
  • Received for publication July 17, 2017
  • Accepted for publication November 8, 2017
  • .

Author Information

  1. Andreas Johannes1,*,
  2. Damien Salomon1,
  3. Gema Martinez-Criado1,2,
  4. Markus Glaser3,
  5. Alois Lugstein3 and
  6. Carsten Ronning4
  1. 1European Synchrotron Radiation Facility, 71 Avenue des Martyrs, Grenoble 30843, France.
  2. 2Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas, 28049 Cantoblanco, Spain.
  3. 3Institute for Solid State Electronics, Technische Universität Wien, Floragasse 7, 1040 Vienna, Austria.
  4. 4Institute of Solid State Physics, Friedrich-Schiller-University Jena, Max-Wien-Platz 1, 07743 Jena, Germany.
  1. *Corresponding author. Email: andreas.johannes{at}esrf.fr

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