Research ArticleAPPLIED PHYSICS

Role of damping in spin Seebeck effect in yttrium iron garnet thin films

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Science Advances  07 Apr 2017:
Vol. 3, no. 4, e1601614
DOI: 10.1126/sciadv.1601614
  • Fig. 1 FMR properties of bare YIG thin-film samples and YIG/Pt bilayered samples.

    (A and B) Graphs showing the FMR field (A) and linewidth (B) as a function of frequency for two different field (H) configurations for bare YIG film sample #5. The dots show the data, and the lines show the fits. The fitting-yielded parameters are also given. (C and D) Graphs presenting the FMR linewidth data (dots) and fits (lines) for six bare YIG film samples (C) and the data and fits for the corresponding YIG films after the growth of a 5-nm-thick Pt capping layer (D).

  • Fig. 2 SSE measurements.

    (A) Graph showing a schematic of the experimental setup. (B to D) Graphs showing the data obtained with YIG/Pt sample #1. (B) Temperatures on the Pt and GGG sides of the sample, TPt and TGGG. (C) ΔT (= TGGGTPt) and the corresponding voltage signal V. The horizontal axes in (B) and (C) show sampling points, and 1000 points correspond to a period of 4 min. (D) The V versus ΔT response plotted using the data in (C). The thin blue line in (D) shows a linear fit.

  • Fig. 3 Effects of damping in the SSE.

    (A) Graph showing the SSE-produced voltage as a function of ΔT (= TGGGTPt) measured on six different YIG/Pt samples. (B) Graph showing the linear fits to the data in (A). (C to E) Graphs showing the SSE coefficient, which is defined by Eq. 4, as a function of αYIG (C), αsp (D), and αYIG + αsp (E).

  • Table 1 Properties of six YIG thin-film samples before and after the growth of a 5-nm-thick Pt capping layer.
    Sample#1#2#3#4#5#6
    D (nm)23.423.423.423.419.722.3
    Meff (G)182019561757182719241913
    αYIG (×10−5)8.5±0.28.7±0.59.4±0.316.5±0.345±159±2
    αYIG/Pt (×10−5)55.8±0.858.4±0.835±158±177±299±2
    αsp (×10−5) (= αYIG/Pt − αYIG)47.349.725.641.53240

Supplementary Materials

  • Supplementary material for this article is available at http://advances.sciencemag.org/cgi/content/full/3/4/e1601614/DC1

    section S1. Sample fabrication

    section S2. Crystalline and structural properties of samples

    section S3. Magnetic properties of samples

    section S4. Summary of sample properties

    section S5. SSE experiments

    table S1. Major control parameters for YIG thin-film fabrication.

    table S2. Surface root-mean-square roughness (nanometers) of bare YIG and YIG/Pt film samples.

    table S3. Properties of six YIG thin-film samples before and after the growth of a 5-nm-thick Pt capping layer.

    fig. S1. X-ray photoelectron spectroscopy data for five YIG thin-film samples.

    fig. S2. X-ray photoelectron spectroscopy data for five YIG thin-film samples.

    fig. S3. Atomic force microscopy surface images of five YIG thin-films samples.

    fig. S4. FMR properties of bare YIG thin-film samples and YIG/Pt bilayered samples.

    fig. S5. Effects of the magnetic field direction on the SSE.

    References (4148)

  • Supplementary Materials

    This PDF file includes:

    • section S1. Sample fabrication
    • section S2. Crystalline and structural properties of samples
    • section S3. Magnetic properties of samples
    • section S4. Summary of sample properties
    • section S5. SSE experiments
    • table S1. Major control parameters for YIG thin-film fabrication.
    • table S2. Surface root-mean-square roughness (nanometers) of bare YIG and YIG/Pt film samples.
    • table S3. Properties of six YIG thin-film samples before and after the growth of a 5-nm-thick Pt capping layer.
    • fig. S1. X-ray photoelectron spectroscopy data for five YIG thin-film samples.
    • fig. S2. X-ray photoelectron spectroscopy data for five YIG thin-film samples.
    • fig. S3. Atomic force microscopy surface images of five YIG thin-films samples.
    • fig. S4. FMR properties of bare YIG thin-film samples and YIG/Pt bilayered samples.
    • fig. S5. Effects of the magnetic field direction on the SSE.
    • References (41–48)

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