Research ArticleChemistry
Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy
- Le Wang1,
- Haomin Wang1,
- Martin Wagner2,
- Yong Yan3,
- Devon S. Jakob1 and
- View ORCID ProfileXiaoji G. Xu1,*
- 1Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.
- 2Bruker Nano, 112 Robin Hill Road, Santa Barbara, CA 93117, USA.
- 3Department of Chemistry and Environmental Science, New Jersey Institute of Technology, Newark, NJ 07102, USA.
- ↵*Corresponding author. Email: xgx214{at}lehigh.edu
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Science Advances 23 Jun 2017:
Vol. 3, no. 6, e1700255
DOI: 10.1126/sciadv.1700255
Vol. 3, no. 6, e1700255
DOI: 10.1126/sciadv.1700255
Le Wang
1Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.
Haomin Wang
1Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.
Martin Wagner
2Bruker Nano, 112 Robin Hill Road, Santa Barbara, CA 93117, USA.
Yong Yan
3Department of Chemistry and Environmental Science, New Jersey Institute of Technology, Newark, NJ 07102, USA.
Devon S. Jakob
1Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.
Xiaoji G. Xu
1Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.
