Electrically driven optical interferometry with spins in silicon carbide

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Science Advances  22 Nov 2019:
Vol. 5, no. 11, eaay0527
DOI: 10.1126/sciadv.aay0527

Article Information

vol. 5 no. 11

Online ISSN: 
  • Received for publication May 15, 2019
  • Accepted for publication September 24, 2019
  • .

Author Information

  1. Kevin C. Miao1,
  2. Alexandre Bourassa1,
  3. Christopher P. Anderson1,2,
  4. Samuel J. Whiteley1,2,
  5. Alexander L. Crook1,2,
  6. Sam L. Bayliss1,
  7. Gary Wolfowicz1,
  8. Gergő Thiering3,
  9. Péter Udvarhelyi3,4,
  10. Viktor Ivády3,5,
  11. Hiroshi Abe6,
  12. Takeshi Ohshima6,
  13. Ádám Gali3,7 and
  14. David D. Awschalom1,2,8,*
  1. 1Institute for Molecular Engineering, University of Chicago, Chicago, IL 60637, USA.
  2. 2Department of Physics, University of Chicago, Chicago, IL 60637, USA.
  3. 3Wigner Research Centre for Physics, Hungarian Academy of Sciences, PO Box 49, H-1525 Budapest, Hungary.
  4. 4Department of Biological Physics, Loránd Eötvös University, Pázmány Péter sétány 1/A, H-1117 Budapest, Hungary.
  5. 5Department of Physics, Chemistry and Biology, Linköping University, SE-581 83 Linköping, Sweden.
  6. 6National Institutes for Quantum and Radiological Science and Technology, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan.
  7. 7Department of Atomic Physics, Budapest University of Technology and Economics, Budafoki út 8, H-1111 Budapest, Hungary.
  8. 8Institute for Molecular Engineering and Materials Science Division, Argonne National Laboratory, Lemont, IL 60439, USA.
  1. *Corresponding author. Email: awsch{at}


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