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Layer-resolved ultrafast extreme ultraviolet measurement of hole transport in a Ni-TiO2-Si photoanode

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Science Advances  03 Apr 2020:
Vol. 6, no. 14, eaay6650
DOI: 10.1126/sciadv.aay6650

Article Information

vol. 6 no. 14

Online ISSN: 
History: 
  • Received for publication July 8, 2019
  • Accepted for publication January 8, 2020
  • .

Author Information

  1. Scott K. Cushing1,*,
  2. Ilana J. Porter2,3,*,
  3. Bethany R. de Roulet2,
  4. Angela Lee2,
  5. Brett M. Marsh2,
  6. Szilard Szoke1,
  7. Mihai E. Vaida2,4 and
  8. Stephen R. Leone2,3,5,
  1. 1Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, CA 91125, USA.
  2. 2Department of Chemistry, University of California, Berkeley, Berkeley, CA 94720, USA.
  3. 3Chemical Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
  4. 4Department of Physics, University of Central Florida, Orlando, FL 32816, USA.
  5. 5Department of Physics, University of California, Berkeley, Berkeley, CA 94720, USA.
  1. Corresponding author. Email: srl{at}berkeley.edu
  • * These authors contributed equally as co-first authors.

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