Research ArticleOPTICS

Generation and characterization of focused helical x-ray beams

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Science Advances  14 Feb 2020:
Vol. 6, no. 7, eaax8836
DOI: 10.1126/sciadv.aax8836

Article Information

vol. 6 no. 7

Online ISSN: 
History: 
  • Received for publication May 8, 2019
  • Accepted for publication November 26, 2019
  • .

Author Information

  1. Lars Loetgering1,2,*,
  2. Margarita Baluktsian3,
  3. Kahraman Keskinbora3,
  4. Roarke Horstmeyer4,
  5. Thomas Wilhein5,
  6. Gisela Schütz3,
  7. Kjeld S. E. Eikema1,2 and
  8. Stefan Witte1,2,*
  1. 1Advanced Research Center for Nanolithography, Science Park 106, 1098 XG Amsterdam, Netherlands.
  2. 2Vrije Universiteit, De Boelelaan 1081, 1081 HV Amsterdam, Netherlands.
  3. 3Max Planck Institute for Intelligent Systems, Heisenbergstraße 3, 70569 Stuttgart, Germany.
  4. 4Duke University, 101 Science Drive, Durham, NC 27708, USA.
  5. 5University of Applied Science Koblenz, Institute for X-Optics, Joseph-Rovan-Allee 2, 53424 Remagen, Germany.
  1. *Corresponding author. Email: l.loetgering{at}arcnl.nl (L.L.); witte{at}arcnl.nl (S.W.)

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