Article Information
vol. 6 no. 9
- Received for publication June 17, 2019
- Accepted for publication December 5, 2019
- .
Author Information
- Yang Hu1,*,
- Fred Florio1,2,*,
- Zhizhong Chen1,
- W. Adam Phelan3,
- Maxime A. Siegler3,
- Zhe Zhou1,
- Yuwei Guo1,
- Ryan Hawks1,
- Jie Jiang1,4,
- Jing Feng4,
- Lifu Zhang1,
- Baiwei Wang1,
- Yiping Wang1,
- Daniel Gall1,
- Edmund F. Palermo1,
- Zonghuan Lu2,
- Xin Sun2,
- Toh-Ming Lu2,
- Hua Zhou5,
- Yang Ren5,
- Esther Wertz2,†,
- Ravishankar Sundararaman1,2,† and
- Jian Shi1,6,†
- 1Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
- 2Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
- 3Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218, USA.
- 4Faculty of Materials Science and Engineering, Kunming University of Science and Technology, Kunming, Yunnan 650093, China.
- 5X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
- 6Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
- ↵†Corresponding author. Email: wertze{at}rpi.edu (E.W.); sundar{at}rpi.edu (R.S.); shij4{at}rpi.edu (J.S.)