Science Advances

Supplementary Materials

This PDF file includes:

  • Sample characterization
  • Fig. S1. STEM imaging and EDS elemental mapping of a Cr-doped (Bi,Sb)2Te3 film on SrTiO3.
  • Magnetic moment fitting procedure
  • Fig. S2. Fitting procedure of magnetic moments.
  • Spatial distribution of the magnetization reversals
  • Fig. S3. Spatial distribution of the magnetization reversal process in 7-QL Cr0.1(BiSb)Te3 sample at T = 250 mK.
  • Global magnetization studies
  • Fig. S4. SQUID magnetometry measurements of a ~40-QL-thick film.
  • Movies of the magnetic moment reversal dynamics
  • Fig. S5. Movie snapshot of magnetization reversal process in 7-QL Cr(BiSb)Te3 film at T = 250 mK.
  • Fig. S6. Movie snapshot of magnetization reversal process in 10-QL Cr-doped (Bi,Sb)2Te3 film at T = 250 mK.
  • Transport and superparamagnetic dynamics in 10-QL Cr-doped (Bi,Sb)2Te3 sample
  • Fig. S7. Magnetization reversal dynamics and transport coefficients in 10-QL-thick Cr-doped (Bi,Sb)2Te3 thin film at T = 250 mK.
  • Fig. S8. Scaling of the cumulative magnetization change and the transverse resistance in 10-QL Cr-doped (Bi,Sb)2Te3 film at T = 250 mK.
  • Transport and superparamagnetism in Mn-doped BiTe
  • Fig. S9. Transport and scanning magnetic imaging of 70-nm-thick Mn-doped BiTe sample at T = 250 mK.
  • Transport measurements
  • Fig. S10. Schematics of transport measurements.
  • Fig. S11. Temperature dependence of the transport coefficients in 7-QL Cr(BiSb)Te3 film.
  • Fig. S12. Gate voltage dependence of Rxx in 7-QL Cr(BiSb)Te3 sample.
  • Fig. S13. Temporal relaxation of transport coefficients near the coercive field in 7-QL Cr(BiSb)Te3 sample.
  • Fig. S14. Transport coefficients in 7-QL Cr(BiSb)Te3 sample with continuous gate excursions.
  • Vg dependence of the dynamics of magnetic relaxation
  • Fig. S15. Statistical analysis of temporal moment relaxation for different Vg values in 7-QL Cr(BiSb)Te3 film at T = 250 mK.
  • AFM of Cr-doped samples
  • Fig. S16. AFM topography images of the two studied Cr-doped (Bi,Sb)2Te3 samples.

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