Science Advances

Supplementary Materials

This PDF file includes:

  • Supplementary Materials and Methods
  • fig. S1. Growth of CdS thin films.
  • fig. S2. Statistical analysis for the size of CdS thin films.
  • fig. S3. Raman spectra of as-obtained CdS sample.
  • fig. S4. PL spectra and PL mapping from the CdS thin films.
  • fig. S5. SKFM characterization of CdS thin film.
  • fig. S6. Topography and phase images of PFM characterization of CdS thin film when different tip voltages (1 to 6 V) were applied.
  • fig. S7. The average amplitude change can be established from eight different areas of CdS sample.
  • fig. S8. Illustration of weak indentation and strong indentation.
  • fig. S9. Thickness versus piezoelectric coefficient distribution from previous literature results.
  • fig. S10. Hall device of CdS thin film.
  • fig. S11. Electrical characterization of CdS thin film.
  • fig. S12. Schematic illustration of experimental setup for DART-PFM.
  • fig. S13. DART-PFM characterization for the boundary of CdS thin film.
  • able S1. Summary of piezoelectric coefficient from different materials.
  • References (4050)

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