Science Advances

Supplementary Materials

This PDF file includes:

  • Supplementary Materials and Methods
  • table S1. Physical properties of 2PTPS, 3PTPS, and 4PTPS.
  • table S2. Work functions with a function of PFI concentration in GraHIL compositions measured by UV photoelectron spectroscopy in air (AC2, Riken Keiki Co. Ltd.).
  • table S3. Calculated HOMO, LUMO, ET, and dipole moment.
  • fig. S1. CV spectra of 2PTPS, 3PTPS, and 4PTPS.
  • fig. S2. UV-vis absorption and photoluminescence of 2PTPS.
  • fig. S3. UV-vis absorption and photoluminescence of 3PTPS.
  • fig. S4. UV-vis absorption and photoluminescence of 4PTPS.
  • fig. S5. Phosphorescence spectra of 2PTPS, 3PTPS, and 4PTPS at 77 K.
  • fig. S6. Chemical structure of PFI.
  • fig. S7. X-ray photoelectron spectroscopy molecular depth profiles of the GraHIL.
  • fig. S8. Angular EL distributions according to viewing angles of solution-processed OLEDs.
  • fig. S9. Normalized EL spectra according to viewing angles of solution-processed OLEDs.
  • fig. S10. CEs of solution-processed OLEDs.
  • fig. S11. Photoluminescence of mixed-host EMLs and UV-vis absorption of phosphorescent dopants.
  • fig. S12. Photoluminescence of mixed-host EMLs according to concentration of phosphorescent dopant.
  • fig. S13. Capacitance versus voltage characteristics of mixed-host EMLs.
  • fig. S14. Current density versus voltage of OLEDs using TCTA/2PTPS EML according to phosphorescent dopants.
  • fig. S15. Schematic illustrations of device structure for solution-processed single-carrier devices.
  • fig. S16. Current density versus voltage of single-carrier devices according to phosphorescent dopants.
  • fig. S17. Negative differential susceptance versus frequency of EODs.
  • fig. S18. Calculated electron mobilities of 2PTPS, 3PTPS, 4PTPS, and TPBI.
  • fig. S19. Density functional theory calculations of 2PTPS, 3PTPS, and 4PTPS.

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