Science Advances

Supplementary Materials

This PDF file includes:

  • Supplementary Text
  • fig. S1. TEM diffraction patterns obtained from the grain boundary region.
  • fig. S2. Bright-field and dark-field TEM images of the introduced dislocations by nanoindentation for the Σ5 grain boundary.
  • fig. S3. Bright-field and dark-field TEM images of the introduced dislocations within the low-angle tilt grain boundary specimen.
  • fig. S4. Dark-field TEM images captured during TEM nanoindentation for the Σ5 grain boundary.
  • fig. S5. Number of the trapped dislocations on the Σ5 grain boundary after nanoindentation.
  • fig. S6. Dark-field TEM image of the Σ5 grain boundary plane after nanoindentation.
  • fig. S7. Dark-field TEM images for the g·b contrast analyses of the trapped dislocations on the Σ5 grain boundary.
  • fig. S8. Bright-field TEM image of dislocation configuration after nanoindentation for the low-angle tilt grain boundary.
  • Legends for movies S1 to S3
  • References (3437)

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Other Supplementary Material for this manuscript includes the following:

  • movie S1 (.mov format). Experimental TEM movie of the in situ nanoindentation experiment for the Σ5 grain boundary.
  • movie S2 (.mov format). Experimental TEM movie of the in situ nanoindentation experiment for the low-angle tilt grain boundary.
  • movie S3 (.mov format). Schematic movie showing the interaction process of lattice screw dislocations with the low-angle tilt grain boundary.

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