Science Advances
Supplementary Materials
This PDF file includes:
- section S1. Selection of STEC enhancers
- section S2. Mechanical characterization of bulk freestanding films
- section S3. Effect of STEC on PEDOT:PSS
- section S4. Morphology of PEDOT/STEC film interior
- section S5. Microscopy study of the effect of tensile strain on PEDOT/STEC films
- section S6. Electrical properties of PEDOT/STEC films
- section S7. Composition of PEDOT/STEC films
- section S8. Low-temperature measurements
- section S9. FoM for transparent conductors
- section S10. Testing geometry for PEDOT films under tensile strain
- section S11. Polarized UV-vis-NIR spectra for PEDOT films under tensile strain
- section S12. Cycling stability and morphological change of PEDOT with STEC additives
- section S13. Mixed ion-electron conductivity
- section S14. PEDOT/STEC as interconnects for FET arrays
- table S1. Summary of STEC structures and their effects on the electrical and mechanical
properties of freestanding PEDOT:PSS films (thickness range, 150 to 200 μm) with 45.5
wt % of STEC.
- table S2. Summary of mobility and threshold voltage shift for the 3 × 3 transistor
arrays under 0 and 125% strain.
- fig. S1. Plot summarizing the conductivity, maximum tensile strain, and Young’s modulus
for freestanding PEDOT:PSS films (~150 μm in thickness) with all additives investigated
in this paper.
- fig. S2. Mechanical characterization of bulk freestanding films.
- fig. S3. Mechanism behind STEC-induced morphology change for PEDOT:PSS films.
- fig. S4. AFM phase images of PEDOT with various additives.
- fig. S5. GIWAXS analyses of PEDOT films.
- fig. S6. Diffraction data for PSS and insoluble PEDOT control samples.
- fig. S7. Plasticizing effect of STEC on PEDOT and NaPSS individually.
- fig. S8. SEM characterization of the cross section of a stretchable PEDOT film.
- fig. S9. Optical microscope images of a PEDOT/STEC1 film supported on a SEBS substrate
under various strains.
- fig. S10. Optical microscope images of a PEDOT/STEC1 film supported on a SEBS substrate
after being stretched to various strains and returned to its original length.
- fig. S11. Surface profile analyses of PEDOT films after stretching.
- fig. S12. Optical microscope images of a PEDOT/STEC1 film upon unloading from 100%
strain.
- fig. S13. Optical microscope images of a PEDOT/STEC2 film held under various tensile
strains.
- fig. S14. Optical microscope images of a PEDOT/STEC2 film upon stretching to various
tensile strains.
- fig. S15. Conductivity values of PEDOT/STEC films processed under different conditions.
- fig. S16. Conductivity of PEDOT/STEC films with various STEC weight % before and
after further STEC solution treatment.
- fig. S17. Effect of further doping using STEC solution on spin-coated films.
- fig. S18. Chemical composition of PEDOT/STEC films.
- fig. S19. Temperature-dependent conductivity and first- and second-order temperature
coefficients for PEDOT films.
- fig. S20. Arrhenius plots for temperature dependent conductivity.
- fig. S21. Schematic diagrams of tensile testing and conductivity measurement geometries.
- fig. S22. Tension-induced chain-alignment behavior of PEDOT/STEC films.
- fig. S23. XPS analysis of film surfaces under 0% versus 100% strain, after returning
from 100% to 0% strain, and after 1000 stretching cycles to 100% strain.
- fig. S24. Cycling stability of PEDOT/STEC1 films.
- fig. S25. Cycling stability of PEDOT/STEC2 films.
- fig. S26. Mixed ion-electron conductivity measurements.
- fig. S27. Schematic showing the cross-sectional view of a linear rigid-island array
connected with stretchable PEDOT.
- fig. S28. Schematic diagrams illustrating strain calculation for rigid-island devices.
- fig. S29. Schematic and transfer characteristics for a 3 × 1 FET array.
- fig. S30. Schematic and transfer characteristics for a 3 × 3 FET array.
- fig. S31. A 3 × 3 FET array being stretched on a spherical object.
Other Supplementary Material for this manuscript includes the following:
Files in this Data Supplement:
