Science Advances

Supplementary Materials

This PDF file includes:

  • section S1. dc conductivity of h-RMnO3
  • section S2. SIM electronics and the calibration process
  • section S3. FEA of the tip-sample interaction
  • section S4. SIM data on polished HoMnO3 samples
  • section S5. SIM circuits and impedance match at different frequencies
  • section S6. More SIM data at various frequencies
  • section S7. Repeated line scans for improving the signal-to-noise ratio
  • section S8. Details of the full model calculations
  • fig. S1. Measurement of the dc resistivity of YMnO3.
  • fig. S2. SIM electronics and the calibration process.
  • fig. S3. FEA of the tip-sample interaction.
  • fig. S4. SIM data on polished HoMnO3 samples.
  • fig. S5. Impedance-match sections at different frequencies.
  • fig. S6. SIM images at various frequencies.
  • fig. S7. SIM experiments with repeated line scans.
  • fig. S8. First principles–based model calculations.
  • References (52–57)

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