Science Advances

Supplementary Materials

This PDF file includes:

  • Supplementary Text
  • fig. S1. RHEED pattern.
  • fig. S2. Piezoresponse force microscopy.
  • fig. S3. Dielectric constant and capacitance at different temperatures.
  • fig. S4. Dielectric constant and capacitance under bending.
  • fig. S5. P-E hysteresis loops under tensile and compressive bending of 5 mm before and after 10 to 1000 bending cycles.
  • fig. S6. ΔP as a function of pulse width at various voltage pulses under compressive and tensile strains.
  • fig. S7. Raman spectra under bending.
  • References (40–43)

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