Science Advances

Supplementary Materials

This PDF file includes:

  • Fabrication and characterization
  • Simulations
  • Nanoimprinting
  • fig. S1. Experimental methods.
  • fig. S2. Optical and microscopic characterization of simple structure.
  • fig. S3. Characterization of dewetted structures.
  • fig. S4. Characterization of the disorder.
  • fig. S5. PF modeling.
  • fig. S6. Initial states for dewetting.
  • fig. S7. Soft nanoimprint lithography process.
  • fig. S8. Nanoimprinted SiO2 patterns on a Si substrate.
  • References (74, 75)

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Other Supplementary Material for this manuscript includes the following:

  • movie S1 (.mpg format). Simple squared patches with R = 1:40.
  • movie S2 (.mpg format). Simple squared patches with AR 1:80.
  • movie S3 (.mpg format). Simple squared patches with R = 1:80 and a central hole.
  • movie S4 (.mpg format). R = 1:80 and four holes.
  • movie S5 (.mpg format). R = 1:80 and three holes on the diagonal.
  • movie S6 (.mpg format). R = 1:80 with cross.
  • movie S7 (.mpg format). R = 1:160 with cross.

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