Science Advances

Supplementary Materials

This PDF file includes:

  • section S1. Materials’ characterization
  • section S2. Second harmonic measurement of the AHE resistance
  • section S3. Current-induced magnetization switching
  • section S4. Damping modulation
  • section S5. Voltage control of spin-orbit torques
  • fig. S1. Characterization of Pt(O) films.
  • fig. S2. Second harmonic measurement of the AHE resistance.
  • fig. S3. Planar Hall effect resistance.
  • fig. S4. Pt(O) layer thickness dependence of the second harmonic AHE resistance.
  • fig. S5. Current-induced magnetization switching.
  • fig. S6. Damping modulation.
  • fig. S7. Device fabrication process.
  • fig. S8. Voltage control of spin-orbit torques.

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