Science Advances

Supplementary Materials

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  • Supplementary Materials
  • Fig. S1. Ex situ device testing for A1618 and A1618C.
  • Fig. S2. Ex situ device testing for M1618 and M1618C.
  • Fig. S3. Ex situ device testing for D1618 and D1618C.
  • Fig. S4. Ex situ device testing for D1630 and D1630C.
  • Fig. S5. Ex situ device testing for D1630RT and D1630RTC.
  • Fig. S6. Reversibility test for unsaturated device.
  • Fig. S7. Reversibility test for saturated device.
  • Fig. S8. SEM characterization of MIP.
  • Fig. S9. SEM characterization of NIP.
  • Fig. S10. Drain current measurements without PVC matrix.
  • Fig. S11. Drain current measurements in 10% PVC matrix.
  • Fig. S12. Drain current measurements in 25% PVC matrix.
  • Fig. S13. Washing tests by cyclic voltammetry.
  • Fig. S14. Diffusion characteristics of the MS-OECT.
  • Fig. S15. Diffusion characteristics of the NS-OECT.
  • Fig. S16. Selectivity tests.
  • Fig. S17. Bending tests.
  • Fig. S18. Stretchability tests.
  • Fig. S19. The reusability tests.
  • Fig. S20. SEM characterization of microchannel arrays.
  • Fig. S21. The performance of acquisition layer.
  • Fig. S22. The reusability test for on-body real sample analysis.
  • Table S1. BET characteristics.
  • Note S1. Nanopore formation in MIP.
  • Note S2. Rationale for MIP design.
  • Note S3. Diffusion characteristics of MSM.

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