Science Advances

Supplementary Materials

This PDF file includes:

  • Section S1. Methods
  • Section S2. Additional information about the XRD results and the surface morphology change reflecting the transition of crystallization orientation and crystallinity
  • Section S3. Thermal stability of oCVD-grown PEDOT thin films
  • Section S4. Raman/FTIR/XPS of oCVD PEDOT thin films
  • Section S5. The influence of film thickness on electrical conductivity and batch reproducibility
  • Section S6. Summarizing the room temperature electrical properties of the oCVD PEDOT samples
  • Section S7. The effect of HBr rinsing on work function and optical properties
  • Section S8. The effect of HBr rinsing on crystallization and surface morphology
  • Section S9. The mechanism of crystallization-orientation transition
  • Section S10. The discussion about Seebeck coefficient measurement
  • Section S11. Sensitivity analysis of the Seebeck coefficient measurement
  • Section S12. The energy barrier Wγ
  • Section S13. The wafer-scale fabrication of RF rectifier arrays and their performance at other frequencies
  • Table S1. The XRD peak intensity for oCVD PEDOT samples in Fig. 1E.
  • Table S2. Crystalline domain size estimated from Scherrer equation.
  • Table S3. Summary of the growth conditions and the resulting PEDOT thin-film properties for the HBr-rinsed thin films.
  • Table S4. The fitting results for the parameters in σE0(T).
  • Fig. S1. The schematic of the oCVD process.
  • Fig. S2. The thermoelectric and electrical measurements.
  • Fig. S3. Schematic representation of out-of-plane conductivity measurement.
  • Fig. S4. The work function of PEDOT samples is determined using XPS.
  • Fig. S5. The room temperature XRD patterns of oCVD PEDOT thin films rinsed with HBr.
  • Fig. S6. The surface morphology of PEDOT thin films deposited at different temperatures.
  • Fig. S7. The thermogravimetric analysis result.
  • Fig. S8. Room temperature Raman spectra of oCVD PEDOT samples.
  • Fig. S9. Room temperature ATR-FTIR results.
  • Fig. S10. XPS for oCVD PEDOT.
  • Fig. S11. Supplementary data of the electrical conductivity (σ) measured at room temperature.
  • Fig. S12. The effect of HBr rinsing on work function and optical properties.
  • Fig. S13. The effect of HBr rinsing on crystallization.
  • Fig. S14. The effect of HBr rinsing on surface morphology of PEDOT thin films.
  • Fig. S15. Calculated EFEt and the sensitivity analysis of the Seebeck coefficient measurement error on the calculated carrier mobility.
  • Fig. S16. Extracting the energy barrier of intercrystallite charge carrier transport.
  • Fig. S17. Wafer-scale fabrication of the RF rectifier arrays.
  • References (3655)

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