Science Advances

Supplementary Materials

This PDF file includes:

  • Section S1. Characterization of polycrystalline graphene sheets
  • Section S2. Wrinkle in polycrystalline graphene
  • Section S3. Characterization of epitaxially grown graphene sheets
  • Section S4. Numerical simulation of Joule heat image of graphene sheets
  • Section S5. Structural characterization of DB
  • Section S6. Speed of LIT imaging
  • Section S7. Heat broadening of LIT measurement in graphene films
  • Section S8. Direction of defects in LIT measurement
  • Fig. S1. Optical microscopy image, Raman spectrum, and SEM image of polycrystalline graphene.
  • Fig. S2. Structural and optical characterization of wrinkle in polycrystalline graphene.
  • Fig. S3. Optical microscopy image of epitaxially grown graphene domains.
  • Fig. S4. Micro-Raman spectroscopy with epitaxially grown graphene.
  • Fig. S5. Simulation of Joule heat imaging.
  • Fig. S6. Structural analysis of overlapped boundary defect.
  • Fig. S7. LIT image dependence on data accumulation time.
  • Fig. S8. Cross-sectional analysis of thermal pattern of LIT.
  • Fig. S9. Effect of the direction of defects in LIT measurements.
  • Table S1. Fitting results of Raman spectrum with polycrystalline graphene.

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