Science Advances

Supplementary Materials

This PDF file includes:

  • Section S1. Sample structures
  • Section S2. MIM images of monolayer WTe2 flake
  • Section S3. Gate dependence of transport and MIM signals
  • Section S4. Simulation of the edge parameters
  • Section S5. The monolayer/bilayer WTe2 flake in Fig. 3
  • Section S6. Gate dependence of internal cracks
  • Fig. S1. MIM-Im images taken for a large monolayer WTe2 flake, overlaid on the optical image at T = 8 K and B = 0.
  • Fig. S2. Gate-dependent MIM images of the sample presented in Fig. 4C.
  • Fig. S3. Gate dependence of transport and MIM.
  • Fig. S4. Simulation of MIM near the edge.
  • Fig. S5. Conceptual model of the effects of disorder on the edge conduction in a magnetic field.
  • Fig. S6. AFM topography image of the monolayer WTe2 flake presented in Fig. 3 (A to D).
  • Fig. S7. Gate dependence of internal cracks.
  • Table S1. Information of the monolayer WTe2 samples presented in the main text.

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