Science Advances

Supplementary Materials

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  • Fig. S1. FTIR measurement of amine-incorporated perovskite material.
  • Fig. S2. XRD patterns of perovskite films before annealing.
  • Fig. S3. Variation of MAPbI3 film morphology with increasing DAP contents.
  • Fig. S4. Effect of different amounts of DAP on perovskite crystal orientation.
  • Fig. S5. Surface roughness of perovskite films.
  • Fig. S6. Dark current measurement.
  • Fig. S7. Energy diagram of PSC device.
  • Fig. S8. Perovskite film thickness and quality.
  • Fig. S9. Hysteresis study.
  • Fig. S10. Lateral device architecture and its current response.
  • Fig. S11. EQE measurement of CFM device.
  • Fig. S12. EQE measurement of the champion MAPbI3-DAP device.
  • Fig. S13. EQE measurement of CFPbIBr-DAP device.
  • Fig. S14. Steady PL measurement of perovskite films with different compositions.
  • Fig. S15. Carrier recombination lifetime.
  • Fig. S16. Light intensity–dependent J-V performances.
  • Fig. S17. Stabilized PCE output.
  • Fig. S18. Perovskite films degradation in ambient air.
  • Fig. S19. Thermal stability test.
  • Table S1. Summarized work functions, valence band maximum (VBM), and conduction band minimum (CBM) positions for different functional layers in the PSCs.
  • Table S2. Photovoltaic parameters of PSCs using bladed MAPbI3 films incorporated with different amounts of DAP amine additives.
  • Table S3. Photovoltaic parameters of PSCs based on MAPbI3-DAP film measured under AM1.5G illumination in different scan directions.

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