Science Advances

Supplementary Materials

The PDF file includes:

  • Section S1. Full data series of the P-E and S-E measurements
  • Section S2. Dynamic piezoelectric measurements
  • Section S3. Intrinsic piezoelectric response of CIPS by in situ micro-XRD
  • Section S4. Quantitative determination of the electrostriction coefficient Q33
  • Section S5. The “dimensional model” and Maxwell strain
  • Section S6. Thickness-dependent piezoelectric response, clamping effect, and electromechanical coupling factor
  • Fig. S1. Voltage-dependent P-E and S-E hysteresis curves.
  • Fig. S2. Frequency-dependent P-E and S-E hysteresis curves.
  • Fig. S3. Voltage-displacement phase relationship in dynamic piezoelectric measurements.
  • Fig. S4. Frequency-dependent piezoelectric response.
  • Fig. S5. Determining the static d33 from S-E curves.
  • Fig. S6. PFM images with box-in-box patterns written.
  • Fig. S7. In situ XRD measurements of the CIPS lattice parameter under electric field.
  • Fig. S8. Quantitative determination of electrostriction coefficient Q33 by linearly fitting the S-P2 curves.
  • Fig. S9. Quantitative determination of electrostriction coefficient Q33 by Q33 = d33/2ε33Ps.
  • Fig. S10. Lattice anomaly around the ferroelectric-paraelectric phase transition.
  • Fig. S11. Comparison between the dimensional model and reduced lattice dimensionality induced negative piezoelectricity.
  • Fig. S12. Switching the polarization of CIPS for single-crystal x-ray crystallography.
  • Fig. S13. Calculated DOS of CIPS.
  • Fig. S14. Calculated energy and polarization changes as a function of applied strain.
  • Fig. S15. Energy and polarization changes as a function of interlayer Cu ratio.
  • Fig. S16. Dynamic piezoelectric measurements of CIPS flakes with different thicknesses.
  • Fig. S17. Nanoindentation test of CIPS single crystal.
  • References (5778)

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Other Supplementary Material for this manuscript includes the following:

  • Data file S1 (.cif format). Crystallographic information file (CIF) of unpoled CIPS crystal.
  • Data file S2 (.cif format). Crystallographic information file (CIF) of poled CIPS crystal.

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