Science Advances
Supplementary Materials
The PDF file includes:
- Fig. S1. DFT-simulated distribution of electronic charge density for Si1C4 defect.
- Fig. S2. DFT-simulated distribution of electronic charge density for Si2C4 defect.
- Fig. S3. DFT-simulated distribution of electronic charge density for Si2C5 (type 1) defect.
- Fig. S4. DFT-simulated distribution of electronic charge density for Si2C5 (type 2) defect.
- Fig. S5. Strain analysis for S1C3 defect.
- Fig. S6. More complex defect structures observed in the STM experiment on STEM sample of graphene.
Other Supplementary Material for this manuscript includes the following:
- Jupyter notebook (atom-finding accuracy versus noise) (.ipynb format)
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