Science Advances

Supplementary Materials

This PDF file includes:

  • Fig. S1. AFM force-distance diagram.
  • Fig. S2. Tip-sample distance dependence of the neutral exciton/trion PL.
  • Fig. S3. Classical TEPL imaging.
  • Fig. S4. Kelvin probe force microscopy.
  • Fig. S5. AFM obtained during TEQPL imaging.
  • Fig. S6. Repeated distance dependence measurements of spot B.
  • Fig. S7. Anticorrelated distributions of neutral excitons and trions under TEQPL.
  • Fig. S8. Mixed distributions of neutral excitons and trions.
  • Fig. S9. The model and simulation of TEQPL.
  • Fig. S10. PL and peak assignment of WS2 on Si/SiO2.

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