Science Advances

Supplementary Materials

This PDF file includes:

  • Fig. S1. Transfer curves of OTFTs.
  • Fig. S2. Strain and stress curves of a blend film.
  • Fig. S3. Poisson’s ratio of blend film.
  • Fig. S4. Rheology analysis of the blend film as a function of frequency.
  • Fig. S5. Rheology study of blend film as a function of temperature.
  • Fig. S6. Differential scanning calorimetry curves of the blended film.
  • Fig. S7. Stress-relaxation result of the blend film.
  • Fig. S8. Recovery test of an elongated blend film.
  • Fig. S9. TEM images of blend film as a function of blend ratio (semiconductor:elastomer).
  • Fig. S10. Polarized UV-vis spectra.
  • Fig. S11. Grazing-incidence wide-angle x-ray scattering patterns.
  • Fig. S12. Grazing-incidence wide-angle x-ray scattering patterns.
  • Fig. S13. Output and transfer curves of OTFT.
  • Fig. S14. Stretching test of blend film.
  • Fig. S15. Durability test of blend film on strain.
  • Fig. S16. Strain and stress curve of bulk blend film after self-healing.
  • Fig. S17. Transfer curves of all pixels in the 5 × 5 fully stretchable active-matrix OTFT array.
  • Fig. S18. Transfer curves of active-matrix sensory transistor and normalized on-current.
  • Fig. S19. Simulation results of maximum principal strain (e1), intermediate principal strain (e2), and minimum principal strain (e3) applied by poking the stretchable active-matrix array.
  • Fig. S20. Fabrication process of PDMS dielectric layer for a stretchable transistor.
  • Table S1. On-currents of active-matrix transistor array for measurement of normalized on-current mapping of the poked transistor array.

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