Science Advances

Supplementary Materials

The PDF file includes:

  • X-ray diffraction
  • Energy-dispersive x-ray spectroscopy
  • Second skyrmion phase at lower T and higher magnetic field
  • Micromagnetic simulation
  • Theoretical analysis
  • Table S1. Crystal data and structure refinement for Cu2OSe(Te)O3.
  • Table S2. Fractional atomic coordinates and equivalent isotropic displacement parameters (Å2 × 103).
  • Table 3. Anisotropic displacement parameters (Å2 × 103).
  • Fig. S1. Energy-dispersive x-ray spectroscopy maps of Cu, Se, O, and Te.
  • Fig. S2. Skyrmion phase diagrams obtained from Te-doped and undoped TEM samples with relatively uniform thickness (~150 nm).
  • Fig. S3. Micromagnetic simulations.
  • Legends for movies S1 to S6
  • References (53, 54)

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Other Supplementary Material for this manuscript includes the following:

  • Movie S1 (.avi format). Video of Te-doped sample under increasing magnetic field at 15 K.
  • Movie S2 (.avi format). Video of Te-doped sample under increasing magnetic field at 25 K.
  • Movie S3 (.avi format). Video of Te-doped sample under increasing magnetic field at 40 K.
  • Movie S4 (.avi format). Video of undoped sample under increasing magnetic field at 15 K.
  • Movie S5 (.avi format). Video of undoped sample under increasing magnetic field at 25 K.
  • Movie S6 (.avi format). Video of undoped sample under increasing magnetic field at 40 K.

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