Science Advances

Supplementary Materials

Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source

F. Mirani, A. Maffini, F. Casamichiela, A. Pazzaglia, A. Formenti, D. Dellasega, V. Russo, D. Vavassori, D. Bortot, M. Huault, G. Zeraouli, V. Ospina, S. Malko, J. I. Apiñaniz, J. A. Pérez-Hernández, D. De Luis, G. Gatti, L. Volpe, A. Pola, M. Passoni

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  • S1 Magnetron sputtering parameters for the deposition of the Cr film.

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