RT Journal Article
SR Electronic
T1 Nanoscale chemical imaging by photoinduced force microscopy
JF Science Advances
JO Sci Adv
FD American Association for the Advancement of Science
SP e1501571
DO 10.1126/sciadv.1501571
VO 2
IS 3
A1 Nowak, Derek
A1 Morrison, William
A1 Wickramasinghe, H. Kumar
A1 Jahng, Junghoon
A1 Potma, Eric
A1 Wan, Lei
A1 Ruiz, Ricardo
A1 Albrecht, Thomas R.
A1 Schmidt, Kristin
A1 Frommer, Jane
A1 Sanders, Daniel P.
A1 Park, Sung
YR 2016
UL http://advances.sciencemag.org/content/2/3/e1501571.abstract
AB Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.