PT  - JOURNAL ARTICLE
AU  - Tsai, Hsinhan
AU  - Liu, Fangze
AU  - Shrestha, Shreetu
AU  - Fernando, Kasun
AU  - Tretiak, Sergei
AU  - Scott, Brian
AU  - Vo, Duc Ta
AU  - Strzalka, Joseph
AU  - Nie, Wanyi
TI  - A sensitive and robust thin-film x-ray detector using 2D layered perovskite diodes
AID  - 10.1126/sciadv.aay0815
DP  - 2020 Apr 01
TA  - Science Advances
PG  - eaay0815
VI  - 6
IP  - 15
4099  - http://advances.sciencemag.org/content/6/15/eaay0815.short
4100  - http://advances.sciencemag.org/content/6/15/eaay0815.full
SO  - Sci Adv2020 Apr 01; 6
AB  - Solid-state radiation detectors, using crystalline semiconductors to convert radiation photons to electrical charges, outperform other technologies with high detectivity and sensitivity. Here, we demonstrate a thin-film x-ray detector comprised with highly crystalline two-dimensional Ruddlesden-Popper phase layered perovskites fabricated in a fully depleted p-i-n architecture. It shows high diode resistivity of 1012 ohm·cm in reverse-bias regime leading to a high x-ray detecting sensitivity up to 0.276 C Gyair−1 cm−3. Such high signal is collected by the built-in potential underpinning operation of primary photocurrent device with robust operation. The detectors generate substantial x-ray photon–induced open-circuit voltages that offer an alternative detecting mechanism. Our findings suggest a new generation of x-ray detectors based on low-cost layered perovskite thin films for future x-ray imaging technologies.