Table 1 Summary of the σ measurement.

Deposition
temperature (°C)
Average
thickness (nm)
Crystallization
orientation
Average
σ (S/cm)
SD of
σ (S/cm)
Relative vertical resistance
through same area*
Anisotropy
//)
190387.4Edge-on0.006450.0030417.33 × 104
19025.7Face-on0.0003720.0001311.152.88 × 106
30028.3Face-on0.001350.0006880.3502.05 × 106

*R/R (190°C-grown edge-on PEDOT) given the same contact area S.